Senior Metrology Lead: Thin-Film X-Ray & Growth Feedback

black.ai is seeking an experienced professional to perform metrology of thin crystalline materials to enhance device performance and yield. The role involves close collaboration with engineering teams and requires advanced knowledge in x-ray characterization. Qualified candidates should hold an MS or PhD in material science, with significant experience in metrology techniques and a background in Si technology being advantageous. This position offers competitive compensation and benefits. #J-18808-Ljbffr Black Inc