Sr. Manager, ATE Test Development Engineer

Achronix is seeking an experienced Senior Manager, Test Development Engineering to lead test program development, characterization, and production test strategies for our FPGA integrated circuits. This role requires deep expertise in Advantest V93000 (93K) ATE, test methodology development, semiconductor process integration, and data-driven yield optimization. The ideal candidate will manage the operations engineering team and work closely with design, product, and DFT teams to define test plans, debug test programs, and improve test efficiency while ensuring cost-effective, high-quality manufacturing.Job Description/ResponsibilitiesAdvantest V93000 (93K) ATE Test Program DevelopmentDevelop, debug, and optimize ATE test programs on the Advantest V93000 (93K) test platform to validate FPGA functionality and performance.Utilize off-line tester tools and emulation environments to prepare and validate test flows before deployment on the ATE.Utilize efficient vector compression with multi-port vector capability for handling large pattern quantities with large vector depths.Own load-board/probe-card design and validation. Ensure test hardware meets performance, reliability, and cost targets,Test Plan Development and ImplementationDefine and execute comprehensive test plans tailored for FPGA architectures in collaboration with design, product, and DFT teams.Implement test methodologies to maximize coverage while optimizing cost, yield, and reliability.Test Pattern and Vector SetupHandle and manipulate industry-standard test pattern formats, including WGL, VCD, EVCD, STIL. In depth understanding of WGL or STIL files and their function.Set up and validate functional, ATPG, MBIST, and high-speed loopback tests.Understand vector file structures, including cycle-based timing relationships, pin-level sequencing, and event-based triggers.Translate simulation patterns into 93K-compatible formats for FPGA functional verification.Debug and modify vector files directly on the ATE as needed for test pattern debug and optimization.Deep understanding of high-speed memory and serial interfaces such as SerDes, GDDR, and DDR test's function, purpose, and methodology.Utilize efficiently Advantest V93000 (93K) multi-port vectors.Commercial pattern conversion tool knowledge.Test Methods DevelopmentCapability of understanding and writing software routines to develop custom test methods to extend ATE’s built-in capabilities to achieve specific test functions such as burning an efuse and digital capture.Write C++ based custom solutions for test automation and result analysis.Device Characterization and Performance ValidationDefine characterization plans for complex high-power FPGA with the DFT team.Analyze process, voltage, and temperature (PVT) variations to assess device performance across environmental and manufacturing conditions, ensuring high-power FPGAs maintain timing, power, and functionality across all specified operating conditions.Define production test limits – Use characterization data to establish pass/fail criteria for high-volume manufacturing, preventing yield loss or excessive fallout by setting optimal test limits based on statistical analysis of device behavior.Identify performance bottlenecks, timing margin issues, and power-integrity failures through detailed characterization analysis, ATE-to-bench correlation by comparing tester results with bench validation measurements.Develop thermal management solution for device under test.Data Analysis and Yield OptimizationATE data processing and transformation – Extract, parse, and structure raw ATE data logs into readable formats such as Excel or SQL databases, ensuring efficient data organization for further analysis.Statistical analysis and data visualization – Perform statistical analysis to identify trends, outliers, and correlations, transforming raw test data into meaningful reports and visualizations enabling effective collaboration with design and product engineering teams.Optimize test limits, process parameters, and binning strategies for yield improvement.Semiconductor Manufacturing IntegrationUnderstand the semiconductor production flow, from wafer fabrication, wafer sort, assembly, to package-level testing. Ensure test strategies align with process variations, yield optimization, and reliability requirements across different manufacturing stages.Integration of test strategies with manufacturing processes – Develop ATE test methodologies that account for fab process variations, back-end packaging challenges, and final test requirements. Collaborate with wafer foundries, outsourced semiconductor assembly and test (OSAT) partners, and supply chain partners to ensure smooth new product introduction (NPI) and high-volume production ramp-up.Yield improvement and optimization – Analyze yield data to identify root causes of failures, implement corrective actions, and optimize test limits, process parameters, and binning strategies to improve overall production yield.Cost and Test Time ReductionDevelop strategies to reduce test cost and optimize throughput without compromising quality.Minimize unnecessary test loops and refine test limits to improve efficiency.Implement parallel and multi-site testing to reduce test time.Package Substrate Design and ReliabilityUnderstand package substrate design principles, including signal integrity, power delivery, and material selection.Identify and mitigate issues such as crosstalk, impedance mismatches, and warpage.Analyze thermal characteristics (θJA, θJC), power dissipation, and cooling solutions to prevent thermal-induced failures.Reliability Qualification and Stress TestingExecute reliability stress tests such as HTOL, HAST, TC, HTS ESD/LU testing to ensure device reliability.Develop burn-in strategies for high-power devices BIB design, and test pattern development.Assess device aging, failure mechanisms, and reliability under operational stress conditions.Understand burn-in oven and its features/design and how they apply to high-power devices.Required SkillsStrong analytical and problem-solving skills in test development, debugging, and failure analysis.Deep knowledge of integrated circuit fundamentals, device physics, and FPGA architecture.Experienced in ATE platforms, particularly Advantest V93000 (93K).Understanding ATPG scan, MBIST, fuse and other structural and functional test methodologies.Understanding reliability stress testing, semiconductor manufacturing flows, and ATE-to-bench correlation.Proficiency in C++, Python, Perl, and data analytics tools (JMP, MATLAB, Excel, SQL, etc.).Preferred SkillsProven ability to manage projects and execute test plans in a fast-paced semiconductor environment.Experience leading cross-functional teams and working in a startup-like, dynamic culture.Strong communication skills and ability to present technical data to both engineers and non-engineers.Demonstrated ability to work independently and manage ambiguity effectively.Education and Experience10+ years of hands-on experience in semiconductor test engineering and product development.Bachelor’s or Master’s degree in Electrical Engineering, Computer Engineering, or related engineering field.