Metrology Engineer - Electron Microscopy & Advanced Characterization

Metrology Engineer – Electron Microscopy & Advanced Characterization Redmond, United States | Posted on 05/13/2026 Responsibilities Own and develop end‑to‑end sample preparation and imaging workflows using Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) techniques. Perform advanced characterization including Scanning Transmission Electron Microscopy (STEM) and Energy Dispersive X‑ray Spectroscopy (EDX/EDS) on complex optical and semiconductor material systems. Drive automation of electron microscopy workflows to improve throughput, repeatability, and data quality across metrology operations. Develop and qualify metrology applications for multi‑layer, multi‑material structures in support of waveguide, thin‑film, and nanofabrication process development. Partner cross‑functionally with process engineering, integration, manufacturing operations, and other metrology disciplines to deliver actionable characterization data for process control and yield improvement. Establish process controls, Measurement Standard Operating Procedures (MSOPs), and specification documents to ensure metrology capability and protect the fab from excursion events. Collaborate with equipment vendors (e.g., Thermo Fisher Scientific/FEI) to qualify, install, and enable state‑of‑the‑art electron microscopy platforms and capabilities. Cross‑train across multiple metrology and inspection disciplines to maintain support continuity and provide complementary measurements for baselining and qualifying application solutions. Contribute to metrology development roadmaps, support technology ramp‑up activities, and deliver leading‑edge process capability in collaboration with cross‑functional and cross‑company teams. Minimum Qualifications Master’s degree in Materials Science, Engineering, Physics, Chemistry, or a related scientific/engineering field. Graduate‑level coursework, research, or hands‑on experience involving: Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) Sample preparation techniques for cross‑section and plan‑view imaging STEM and/or EDX analytical methods Characterization of semiconductor or optical materials Mackin Talent offers an attractive benefits package which includes major medical carrier, 15 days of PTO plus Holiday and Sick pay, paid volunteer hours, paternity/maternity leave and many more. #J-18808-Ljbffr Mackin Talent