Postdoctoral Researcher - Electrically Driven Ultrafast Electron Microscopy (RF Nanoscale Dynamics)

Overview The Nanoscience and Technology Division (NST) at Argonne National Laboratory invites applications for a postdoctoral researcher to lead cutting‑edge efforts in electrically driven ultrafast electron microscopy of materials and nanostructures for electronics. This capability at Argonne’s Center for Nanoscale Materials enables imaging of electrically driven dynamics with simultaneous nanometer‑scale spatial resolution and nanosecond‑scale temporal resolution. The successful candidate will further advance this platform to access new spatial and temporal regimes and will spearhead first‑of‑their‑kind investigations of radiofrequency (MHz–GHz) nanoscale phenomena in systems relevant to microelectronics and quantum information science. Opportunities also exist for cross‑platform studies integrating ultrafast TEM with ultrafast x‑ray measurements at Argonne’s Advanced Photon Source and complementary optical spectroscopy. The position offers a highly collaborative environment with experts in electronic materials and devices, advanced characterization, nanofabrication, and theory/modeling. Key Responsibilities Perform transmission electron microscopy and spectroscopy, including insitu and ultrafast measurements Design and fabricate nanoscale electrical test structures (e.g., photolithography, e‑beam lithography) Design, test, and characterize radiofrequency (RF) circuitry and measurement approaches Analyze and interpret data; publish and present high‑impact research results Position Requirements Recent or soon‑to‑be‑completed PhD (within the last 0‑5 years) in field of materials science, physics, electrical engineering, or a related field Demonstrated experience with scanning/transmission electron microscopy (S/TEM) and/or diffraction (Lorentz S/TEM experience is a plus) Strong foundation in electronics and devices, including electrical measurements (RF circuit experience is a plus) Experience in nanofabrication, including photolithography and/or electron‑beam lithography Experience with TEM specimen preparation using focused ion beam (FIB) is preferred Programming proficiency (e.g., Python) for experiment automation and/or image analysis is preferred Background in electronic, magnetic, or optical materials is preferred; experience in ultrafast science is a plus Strong record of peer‑reviewed publications Ability to model Argonne’s core values of impact, safety, respect, integrity, and teamwork Compensation and Benefits The expected hiring range for this position is $72,879.00–$121,465.00. The pay offered to a selected candidate will be determined based on factors such as, but not limited to, the scope and responsibilities of the position, the qualifications of the selected candidate, business considerations, internal equity, and external market pay for comparable jobs. Additionally, comprehensive benefits are part of the total rewards package. EEO Statement As an equal employment opportunity employer, and in accordance with our core values of impact, safety, respect, integrity and teamwork, Argonne National Laboratory is committed to a safe and welcoming workplace that fosters collaborative scientific discovery and innovation. Argonne encourages everyone to apply for employment. Argonne is committed to nondiscrimination and considers all qualified applicants for employment without regard to any characteristic protected by law. Contact Information For more information or to request a reasonable accommodation or other application support, contact us anytime at View email address on click.appcast.io or View phone number on click.appcast.io. #J-18808-Ljbffr Argonne National Laboratory