Postdoctoral Fellow: Nano-Scale X-Ray Metrology
Johns Hopkins University
Johns Hopkins University in Gaithersburg seeks a Research Associate for the NIST CHIPS project, focusing on advanced X-ray metrology methods to characterize nanometer-scale thin films. Qualified candidates will conduct research, publish findings, and present at conferences. Applicants must possess a Ph.D. in a relevant field and have experience with X-ray measurement techniques. Strong communication skills are also essential. Join a team that promotes scientific excellence and equal opportunity. #J-18808-Ljbffr Johns Hopkins University
Vacancy posted 2 days ago
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